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Design, development, and testing of X-band amplifying reflectarrays

โœ Scribed by Bialkowski, M.E.; Robinson, A.W.; Song, H.J.


Book ID
115526436
Publisher
IEEE
Year
2002
Tongue
English
Weight
450 KB
Volume
50
Category
Article
ISSN
0018-926X

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Reflection loss and bandwidth performanc
โœ Muhammad Inam Abbasi; Muhammad Y. Ismail ๐Ÿ“‚ Article ๐Ÿ“… 2010 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 407 KB

## Abstract A technique for the measurement of scattering parameters of an infinite reflectarray is presented which takes into account effects of mutual coupling. Infinite reflectarrays designed at 10 GHz with different substrate thicknesses have been analyzed in which maximum 10% and 20% bandwidth