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Reflection loss and bandwidth performance of X-band infinite reflectarrays: Simulations and measurements

✍ Scribed by Muhammad Inam Abbasi; Muhammad Y. Ismail

Book ID
102516580
Publisher
John Wiley and Sons
Year
2010
Tongue
English
Weight
407 KB
Volume
53
Category
Article
ISSN
0895-2477

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✦ Synopsis

Abstract

A technique for the measurement of scattering parameters of an infinite reflectarray is presented which takes into account effects of mutual coupling. Infinite reflectarrays designed at 10 GHz with different substrate thicknesses have been analyzed in which maximum 10% and 20% bandwidth values from resonance are shown to be 157 MHZ and 250 MHz, respectively, constructed on 0.508‐mm thick substrate. Moreover, a figure of merit (FOM) has been defined which decreases from 0.320 to 0.26 °/MHz as the substrate thickness is increased from 0.127 to 0.508 mm, and the results demonstrate a significant decrease in the slope of reflection phase curve. © 2010 Wiley Periodicals, Inc. Microwave Opt Technol Lett 53:77–80, 2011; View this article online at wileyonlinelibrary.com. DOI 10.1002/mop.25662

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