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Depth profiling of W, O and H in tungsten trioxide thin films using RBS and ERDA techniques

✍ Scribed by O. Bohnke; G. Frand; M. Fromm; J. Weber; O. Greim

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The use of HI-ERDA/RBS and NRA/RBS to de

✍ R.W. Smith; J. Plaza; D. Ghita; M. Sánchez; B.J. García; A. Muñoz-Martín; A. Cli 📂 Article 📅 2008 🏛 Elsevier Science 🌐 English ⚖ 144 KB