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Depth profiling of high-fluence O- and Cl-implanted YBa2Cu3O7−δ films by photoemission spectroscopy

✍ Scribed by M. Klauda; K. Kragler; I. Khassanov; C. Fink; Ch. Buchal; G. Saemann-Ischenko

No coin nor oath required. For personal study only.

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