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Segregation, interface reactions and surface topography of YBa2Cu3O7−δ thin films, investigated by Auger depth profiling, microprobe analysis, STM and SEM

✍ Scribed by J.K. Grepstad; Ph. Niedermann; J.-M. Triscone; L. Antognazza; M.G. Karkut; Ø. Fischer


Publisher
Elsevier Science
Year
1988
Tongue
English
Weight
623 KB
Volume
153-155
Category
Article
ISSN
0921-4534

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