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Depth profiling of GaN by cathodoluminescence microanalysis

✍ Scribed by Fleischer, K.; Toth, M.; Phillips, M. R.; Zou, J.; Li, G.; Chua, S. J.

Book ID: 121829958
Publisher: American Institute of Physics
Year: 1999
Tongue: English
Weight: 807 KB
Volume: 74
Category: Article
ISSN: 0003-6951
DOI: 10.1063/1.123460

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