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Depth profiling of Bi-Sr-Ca-Cu-O thin films by secondary neutrals mass spectroscopy

✍ Scribed by M. Lorenz; B. Börner; H. Hochmuth; K. Unger

Book ID
103946374
Publisher
Elsevier Science
Year
1993
Tongue
English
Weight
815 KB
Volume
215
Category
Article
ISSN
0921-4534

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