Depth profile study on Raman spectra of high-energy-electron-irradiated hydrogenated amorphous silicon films

✍ Scribed by NaiMan Liao; Wei Li; YaDong Jiang; Zhao Liu; KangCheng Qi; ZhiMing Wu; ShiBin Li

• Book ID: 107356212
• Publisher: SP Science China Press
• Year: 2009
• Tongue: English
• Weight: 520 KB
• Volume: 52
• Category: Article
• ISSN: 1006-9321
• DOI: 10.1007/s11431-008-0343-y