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Depth profile investigations of silicon nanocrystals formed in sapphire by ion implantation

✍ Scribed by Yerci, S.; Yildiz, I; Kulakci, M.; Serincan, U.; Barozzi, M.; Bersani, M.; Turan, R.

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Properties of InAs nanocrystals in silic

✍ A.L Tchebotareva; J.L Brebner; S Roorda; C.W White 📂 Article 📅 2001 🏛 Elsevier Science 🌐 English ⚖ 485 KB

Depth Profiling of Ion Implanted Silicon

✍ Dutt, M. B. ;Kumar, R. ;Nath, R. ;Sen, M. N. ;Laroia, K. K. 📂 Article 📅 1986 🏛 John Wiley and Sons 🌐 English ⚖ 475 KB

Depth profiles of cluster-ion-implanted

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Visible photoluminescence from silicon n

✍ Tsutomu Shimizu-Iwayama; Yoichi Terao; Atsushi Kamiya; Motonori Takeda; Setsuo N 📂 Article 📅 1996 🏛 Elsevier Science 🌐 English ⚖ 398 KB

Formation of silicon nanocrystals in sap

✍ Yerci, S.; Serincan, U.; Dogan, I.; Tokay, S.; Genisel, M.; Aydinli, A.; Turan, 📂 Article 📅 2006 🏛 American Institute of Physics 🌐 English ⚖ 343 KB

Analysis of depth profiles of implanted

✍ J.H. Liang 📂 Article 📅 1998 🏛 Springer 🌐 English ⚖ 226 KB