Depth distribution and bonding states of phosphorus implanted in titanium investigated by AES, XPS and SIMS

✍ Scribed by Baunack, S.; Oswald, S.; Scharnweber, D.

• Publisher: John Wiley and Sons
• Year: 1998
• Tongue: English
• Weight: 338 KB
• Volume: 26
• Category: Article
• ISSN: 0142-2421
• DOI: 10.1002/(sici)1096-9918(19980515)26:6<471::aid-sia391>3.0.co;2-s

✦ Synopsis

The depth distribution of phosphorus implanted in titanium at 20 keV with doses ranging from 1 Â 1015 to 3 Â 1017 cm-2 was investigated by AES, SIMS and XPS. For small doses (O1016 cm-2) Gaussian-like phosphorus proÐles have been observed. For doses > 1017 cm-2 the depth proÐles suggest that a TiP-like surface layer is formed without additional thermal treatment. In the implanted layer a certain amount of oxygen was found.

Factor analysis of the spectra obtained during AES and XPS depth proÐling proved that the surface region of the implanted samples is composed of Ti metal, surface oxide and Ti phosphide, which is produced at high doses.

From P VV Auger spectra the existence of a second bonding state of phosphorus is deduced, which is L 2, 3 distinguished from TiP by di †erences in the peak shape and position. This species is distributed mainly in a narrow proÐle located at a depth near the projected range of the phosphorus ions, i.e. in the region of maximum lattice defects. It is attributed to phosphorus on interstitial sites. The amount of this species reaches saturation for a dose of ¿1017 cm-2.