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Deposition characteristics of Ti−Si−N films reactively sputtered from various targets in a N2/Ar gas mixture

✍ Scribed by W. H. Lee; S. K. Park; B. J. Kang; P. J. Reucroft; J. G. Lee


Book ID
107452656
Publisher
Springer US
Year
2001
Tongue
English
Weight
160 KB
Volume
30
Category
Article
ISSN
0361-5235

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