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Deposition and characterization of MAX-phase containing Ti–Si–C thin films by sputtering using elemental targets

✍ Scribed by Sonoda, Tsutomu; Nakao, Setsuo; Ikeyama, Masami


Book ID
122072316
Publisher
Elsevier Science
Year
2013
Tongue
English
Weight
495 KB
Volume
92
Category
Article
ISSN
0042-207X

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