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Dependence of the surface topology and raman scattering spectra of GexSi1−x/Si films on the composition variation over the layer thickness

✍ Scribed by L. S. Lunin, I. A. Sysoev, M. D. Bavizhev, V. A. Lapin…


Book ID
120803741
Publisher
SP MAIK Nauka/Interperiodica
Year
2013
Tongue
English
Weight
591 KB
Volume
58
Category
Article
ISSN
1063-7745

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