Dependence of structures and electrical properties on oxygen content in Nd2−xCexCuO4−y films
✍ Scribed by T. Yoshitake; T. Satoh; J. Fujita; H. Igarashi
- Publisher
- Elsevier Science
- Year
- 1991
- Tongue
- English
- Weight
- 364 KB
- Volume
- 174
- Category
- Article
- ISSN
- 0921-4534
No coin nor oath required. For personal study only.
📜 SIMILAR VOLUMES
Using Nd 2\_xCe~CuO4 ,. films, the temperature dependence of electrical resistivity in the mixed state has been measured as a function of magnetic field and its direction from the basal plane. These data have been analyzed by a phenomenological theory on the basis of the thermal fluctuations of the
A strong dependence of the cerium distribution coefficient (Kc~) on oxygen partial pressure P[O2] has been shown in direct .lalm 0.2 arm TSFZ experiments by changing the oxygen pressure during Nd2\_xCe~CuO4 single crystal growth. The ratio of K°~ /Kc~ has been found to be equal to ~ 0.62. Absolute v
The effect of oxygen content on the electrical transport properties of La 0.4 Ca 0.6 MnO 3--y was studied. Upon decreasing oxygen content, the lattice parameters a, b and c of the samples increase and the electrical resistivity of the samples also increases abruptly, contradicting what is expected i