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Dependence of interface state density on the atomic roughness at the Si — SiO2 interface

✍ Scribed by Peter O. Hahn; S. Yokohama; M. Hengler


Book ID
118985496
Publisher
Elsevier Science
Year
1984
Tongue
English
Weight
595 KB
Volume
142
Category
Article
ISSN
0039-6028

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