𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Dependence of critical layer thickness on strain for InxGa1−xAs/GaAs strained-layer superlattices

✍ Scribed by Fritz, I. J.; Picraux, S. T.; Dawson, L. R.; Drummond, T. J.; Laidig, W. D.; Anderson, N. G.


Book ID
120497952
Publisher
American Institute of Physics
Year
1985
Tongue
English
Weight
455 KB
Volume
46
Category
Article
ISSN
0003-6951

No coin nor oath required. For personal study only.


📜 SIMILAR VOLUMES


Strain measurements in InxGa1-xAs/GaAs s
✍ V. Lemos; C. Vázquez-López; F. Cerdeira 📂 Article 📅 1993 🏛 Elsevier Science 🌐 English ⚖ 140 KB

We performed a series of Raman and photoreflectance measurements on several \(I n_{x} G a_{1-x} A s / G a A s\) strained layer superlattices of the same period but of different alloy compositions and substrate orientations. Both types of measurements are used in order to estimate the in-plane strain