Density of silicon atoms in the Si(111) √3 × √3-Ag structure by in situ UHV reflection electron microscopy

✍ Scribed by Y. Tanishiro; K. Takayanagi; K. Yagi

• Publisher: Elsevier Science
• Year: 1991
• Weight: 618 KB
• Volume: 258
• Category: Article
• ISSN: 0167-2584
• DOI: 10.1016/0167-2584(91)90663-c