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Density Investigation by X-ray Reflectivity for Thin Films Synthesized Using Atmospheric CVD

✍ Scribed by Shinichi Kishimoto; Tomoaki Hashiguchi; Shigeo Ohshio; Hidetoshi Saitoh


Publisher
John Wiley and Sons
Year
2008
Tongue
English
Volume
14
Category
Article
ISSN
0948-1907

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