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Density Investigation by X-ray Reflectivity for Thin Films Synthesized Using Atmospheric CVD

✍ Scribed by Shinichi Kishimoto; Tomoaki Hashiguchi; Shigeo Ohshio; Hidetoshi Saitoh

Publisher: John Wiley and Sons
Year: 2008
Tongue: English
Volume: 14
Category: Article
ISSN: 0948-1907
DOI: 10.1002/cvde.200806703

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