Demonstration of Intrinsic Tristability in Double-Barrier Resonant Tunneling Diodes With the Wigner Transport Equation

✍ Scribed by Yoder, P.D.; Grupen, M.; Smith, R.K.

• Book ID: 114620228
• Publisher: IEEE
• Year: 2010
• Tongue: English
• Weight: 259 KB
• Volume: 57
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/ted.2010.2081672