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Demonstration of a focused ion-beam cross-sectioning technique for ultrastructural examination of resin-dentin interfaces

✍ Scribed by Bart Van Meerbeek; Linc J. Conn Jr.; E. Steven Duke; David Schraub; Farid Ghafghaichi

Book ID: 113233780
Publisher: Elsevier Science
Year: 1995
Tongue: English
Weight: 884 KB
Volume: 11
Category: Article
ISSN: 0109-5641
DOI: 10.1016/0109-5641(95)80039-5

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## Abstract The surface properties of materials are believed to control most of the biological reactions toward implanted materials. To study the surface structure, elemental distribution, and morphology, using transmission electron microscopy (TEM) techniques, thin foils of the surface (in cross‐s