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Delay Estimation on Single-Electron Tunneling-Based Logic Gates

✍ Scribed by Chunhong Chen

Book ID: 118215291
Publisher: IEEE
Year: 2011
Tongue: English
Weight: 542 KB
Volume: 10
Category: Article
ISSN: 1536-125X
DOI: 10.1109/tnano.2011.2120617

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