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Degradation of the diode ideality factor of silicon n–p junctions

✍ Scribed by Mario El-Tahchi; Antonio Khoury; Marc De Labardonnie; Pierre Mialhe; Frédéric Pelanchon


Book ID
108472760
Publisher
Elsevier Science
Year
2000
Tongue
English
Weight
137 KB
Volume
62
Category
Article
ISSN
0927-0248

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