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Degradation of PVF2 capacitors during accelerated test : J. W. Burough, W. G. Brammer and John Burnham. Proc. IEEE Reliab. Phys. Symp., San Diego (18–20 April 1978), p. 219

Publisher: Elsevier Science
Year: 1978
Tongue: English
Weight: 127 KB
Volume: 18
Category: Article
ISSN: 0026-2714
DOI: 10.1016/0026-2714(78)90043-4

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