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Degradation of photoresponse time of a-Si:H and correlation with NI measured by low frequency C-V method

✍ Scribed by Kohji Mori; Eiichi Ohta; Masumitsu Ino; Katsuhiko Tani

Book ID: 118333409
Publisher: Elsevier Science
Year: 1985
Tongue: English
Weight: 140 KB
Volume: 77-78
Category: Article
ISSN: 0022-3093
DOI: 10.1016/0022-3093(85)90688-x

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