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Degradation of InGaAs/InP single heterojunction bipolar transistors under high energy electron irradiation

✍ Scribed by A. Bandyopadhyay; S. Subramanian; S. Chandrasekhar; A. Dentai; S.M. Goodnick

Book ID: 108362405
Publisher: Elsevier Science
Year: 1999
Tongue: English
Weight: 343 KB
Volume: 39
Category: Article
ISSN: 0026-2714
DOI: 10.1016/s0026-2714(99)00004-9

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