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Degradation of CMOS-integrated electronics under ionizing irradiation

✍ Scribed by D. Zer-Zion; A. Seidman; U. Koetz

Book ID: 113391636
Publisher: Elsevier Science
Year: 1991
Tongue: English
Weight: 376 KB
Volume: 23
Category: Article
ISSN: 0920-5632
DOI: 10.1016/0920-5632(91)90064-l

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It has been known for some time that ionizing radiation has profound effects on integrated circuits. These need to be considered when such devices may be subjected to radiation environments, such as in the space and nuclear industries. As even the space industry is making increased use of commercial