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Degradation mechanisms in 2 W MESFETs

✍ Scribed by C. Canali; F. Magistrali; A. Paccagnella; M. Sangalli; C. Tedesco; E. Zanoni


Book ID
112184658
Publisher
John Wiley and Sons
Year
1991
Tongue
English
Weight
625 KB
Volume
7
Category
Article
ISSN
0748-8017

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