Degradation mechanism in Si-doped Al/Si contacts and an extremely stable metallization system : Masamichi Mori, Shuichi Kanamori and Takemi Ueki. IEEE Trans. Components Hybrids Mfg Technol.CHMT-6 (2) 159 (June 1983)

• Book ID: 103278942
• Publisher: Elsevier Science
• Year: 1984
• Tongue: English
• Weight: 253 KB
• Volume: 24
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(84)90604-8