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Defects in separation by implanted oxygen wafer probed by monoenergetic positron beams

โœ Scribed by A. Uedono; S. Watauchi; Y. Ujihira; L. Wei; S. Tanigawa; R. Suzuki; H. Ohgaki; T. Mikado; H. Kametani; H. Akiyama; Y. Yamaguchi; M. Koumaru


Book ID
112373771
Publisher
Springer
Year
1993
Tongue
English
Weight
265 KB
Volume
79
Category
Article
ISSN
0304-3843

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