𝔖 Bobbio Scriptorium
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Defects in Quenched Silicon

✍ Scribed by M. L. Swanson


Book ID
104538600
Publisher
John Wiley and Sons
Year
1969
Tongue
English
Weight
649 KB
Volume
33
Category
Article
ISSN
0370-1972

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Prepared specimens of pure aluminium (99.999%) in the form of thin sheets of 100-mm thickness were used for electrical resistivity measurements. Samples were quenched after heating at different temperatures ranging from 373 to 723 K for 30 min. Samples were also annealed for a constant time of 30 mi