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Defects and transport properties of electron-irradiated microcrystalline silicon with successive annealing

✍ Scribed by W. Bronner; J.P. Kleider; R. Brüggemann; M. Mehring

Book ID: 108388569
Publisher: Elsevier Science
Year: 2003
Tongue: English
Weight: 106 KB
Volume: 427
Category: Article
ISSN: 0040-6090
DOI: 10.1016/s0040-6090(02)01240-3

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