Defect Reduction in Sublimation Grown Silicon Carbide Crystals by Adjustment of Thermal Boundary Conditions

✍ Scribed by Schmitt, Erwin; Rasp, Michael; Weber, Arnd Dietrich; Kölbl, M.; Eckstein, Robert; Kadinski, L.; Selder, M.

• Book ID: 120643453
• Publisher: Trans Tech Publications, Ltd.
• Year: 2001
• Tongue: English
• Weight: 478 KB
• Volume: 353-356
• Category: Article
• ISSN: 1662-9752
• DOI: 10.4028/www.scientific.net/MSF.353-356.15