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Defect recognition and image processing in III-V compounds: Edited by J.P. Fillard. Elsevier, Amsterdam (1985), 302+ pp. Price: $84.50/Dfl. 245.00 ISBN 0-444-42558-6

✍ Scribed by D.C. Look

Book ID: 113187254
Publisher: Elsevier Science
Year: 1986
Tongue: English
Weight: 46 KB
Volume: 21
Category: Article
ISSN: 0025-5408
DOI: 10.1016/0025-5408(86)90139-x

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📜 SIMILAR VOLUMES

J. P. Fillard (ed.). Defect recognition

J. P. Fillard (ed.). Defect recognition and image processing in III-V compounds. Proceedings of the International Symposium on Defect Recognition and Image Processing in III-V Compounds, Montpellier, France, July 2–4, 1985. Elsevier, Amsterdam-Oxford-New York-Tokyo 1985. VIII + 302 pages. US $ 84.50/Dfl. 245.00. In USA/Canada, the book is available from Elsevier Science, Publ. Co., New York, NY 10163, ISBN 0-444-42558-0

✍ P. Paufler 📂 Article 📅 1987 🏛 John Wiley and Sons 🌐 English ⚖ 54 KB 👁 1 views