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J. P. Fillard (ed.). Defect recognition and image processing in III-V compounds. Proceedings of the International Symposium on Defect Recognition and Image Processing in III-V Compounds, Montpellier, France, July 2–4, 1985. Elsevier, Amsterdam-Oxford-New York-Tokyo 1985. VIII + 302 pages. US $ 84.50/Dfl. 245.00. In USA/Canada, the book is available from Elsevier Science, Publ. Co., New York, NY 10163, ISBN 0-444-42558-0

✍ Scribed by P. Paufler

Publisher
John Wiley and Sons
Year
1987
Tongue
English
Weight
54 KB
Volume
22
Category
Article
ISSN
0232-1300

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📜 SIMILAR VOLUMES

E. R. Weber (ed.). Defect recognition an
E. R. Weber (ed.). Defect recognition and image processing in III-V compounds II. Proc. of the Second International Symposium on Defect Recognition and Image Processing In III-V Compounds (DRIP II), Monterey, California, April 27–29, 1987. Elsevier science Publishers, Amsterdam 1987. VIII + 320 pages, US $ 102.75/Dfl. 195.00. ISBN 0-444-42892-5. The book is also available from Elsevier Science Publ. Co. Inc., New York, NY 10163
✍ P. Paufler 📂 Article 📅 1989 🏛 John Wiley and Sons 🌐 English ⚖ 76 KB