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Defect-pool model parameters for amorphous silicon derived from field-effect measurements

✍ Scribed by S.C. Deane; M.J. Powell

Book ID: 115989007
Publisher: Elsevier Science
Year: 1993
Tongue: English
Weight: 309 KB
Volume: 164-166
Category: Article
ISSN: 0022-3093
DOI: 10.1016/0022-3093(93)90555-c

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