✦ LIBER ✦
Identification of the dominant electron deep trap in amorphous silicon from ESR and modulated photocurrent measurements: implications for defect models
✍ Scribed by J David Cohen; Daewon Kwon
- Book ID
- 117148797
- Publisher
- Elsevier Science
- Year
- 1998
- Tongue
- English
- Weight
- 129 KB
- Volume
- 227-230
- Category
- Article
- ISSN
- 0022-3093
No coin nor oath required. For personal study only.