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Defect model in thin dielectric films

✍ Scribed by T.K. Lin; V.K. Agarwal

Publisher: Elsevier Science
Year: 1988
Tongue: English
Weight: 161 KB
Volume: 164
Category: Article
ISSN: 0040-6090
DOI: 10.1016/0040-6090(88)90134-4

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