๐”– Bobbio Scriptorium
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Defect Level as a Function of Fault Coverage

โœ Scribed by Williams, T.W.; Brown, N.C.


Book ID
114606434
Publisher
IEEE
Year
1981
Tongue
English
Weight
351 KB
Volume
C-30
Category
Article
ISSN
0018-9340

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IDDQtesting as a component of a test sui
โœ Peter C. Maxwell; Robert C. Aitken ๐Ÿ“‚ Article ๐Ÿ“… 1992 ๐Ÿ› Springer US ๐ŸŒ English โš– 940 KB

This article is concerned with the role of IDDQ testing, in conjunction with other types of tests, in achieving high quality. In particular, the argument is made that rather than use a single fault coverage, it is better to obtain a number of different coverages, for different types of faults. To de