✦ LIBER ✦
Fault coverage and defect level estimation models for partially testable MCMs
✍ Scribed by Tseng, W.-D.; Wang, K.
- Book ID
- 114447761
- Publisher
- The Institution of Electrical Engineers
- Year
- 2000
- Tongue
- English
- Weight
- 675 KB
- Volume
- 147
- Category
- Article
- ISSN
- 1350-2409
No coin nor oath required. For personal study only.