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Defect imaging and channeling studies using channeling scanning transmission ion microscopy

✍ Scribed by P.J.C. King; M.B.H. Breese; P.J.M. Smulders; P.R. Wilshaw; G.W. Grime

Book ID: 113287137
Publisher: Elsevier Science
Year: 1996
Tongue: English
Weight: 723 KB
Volume: 118
Category: Article
ISSN: 0168-583X
DOI: 10.1016/0168-583x(95)01091-2

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## Abstract The imaging and characterization of dislocations is commonly carried out by thin foil transmission electron microscopy (TEM) using diffraction contrast imaging. However, the thin foil approach is limited by difficult sample preparation, thin foil artifacts, relatively small viewable are