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Defect-Enhanced Electron Transport through Semiconductor Barriers

✍ Scribed by L. El Mir; J.C. Bourgoin

Publisher: John Wiley and Sons
Year: 1998
Tongue: English
Weight: 286 KB
Volume: 207
Category: Article
ISSN: 0370-1972
DOI: 10.1002/(sici)1521-3951(199806)207:2<577::aid-pssb577>3.0.co;2-x

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