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Defect characterization in silicon particle detectors irradiated with Li ions

✍ Scribed by Scaringella, M.; Menichelli, D.; Candelori, A.; Rando, R.; Bruzzi, M.

Book ID
114663734
Publisher
IEEE
Year
2006
Tongue
English
Weight
206 KB
Volume
53
Category
Article
ISSN
0018-9499

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