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Defect characterization in CeO2−x at elevated temperatures—II: Neutron diffraction

✍ Scribed by John Faber Jr.; Martin A. Seitz; Melvin H. Mueller

Publisher: Elsevier Science
Year: 1976
Tongue: English
Weight: 583 KB
Volume: 37
Category: Article
ISSN: 0022-3697
DOI: 10.1016/0022-3697(76)90030-5

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