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Defect characterization in CeO2−x at elevated temperatures. II: Neutron diffraction

✍ Scribed by John Faber Jr.; MartinA. Seitz; MelvinH. Mueller

Publisher: Elsevier Science
Year: 1976
Tongue: English
Weight: 88 KB
Volume: 19
Category: Article
ISSN: 0038-1098
DOI: 10.1016/0038-1098(76)90711-0

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