✦ LIBER ✦

Deep ultraviolet Raman scattering characterization of ion-implanted SiC crystals

✍ Scribed by Nakashima, S.; Mitani, T.; Senzaki, J.; Okumura, H.; Yamamoto, T.

Book ID: 111963682
Publisher: American Institute of Physics
Year: 2005
Tongue: English
Weight: 349 KB
Volume: 97
Category: Article
ISSN: 0021-8979
DOI: 10.1063/1.1931039

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Deep Ultraviolet Raman Microspectroscopi

Deep Ultraviolet Raman Microspectroscopic Characterization of Polishing-Induced Surface Damage in SiC Crystals

✍ Nakashima, S.; Kato, T.; Nishizawa, S.; Mitani, T.; Okumura, H.; Yamamoto, T. 📂 Article 📅 2006 🏛 The Electrochemical Society 🌐 English ⚖ 145 KB

Raman scattering and photoluminescence o

Raman scattering and photoluminescence of As ion-implanted ZnO single crystal

✍ Jeong, T. S.; Han, M. S.; Youn, C. J.; Park, Y. S. 📂 Article 📅 2004 🏛 American Institute of Physics 🌐 English ⚖ 308 KB

[Advanced Texts in Physics] Silicon Carb

[Advanced Texts in Physics] Silicon Carbide Volume 1277 || Characterization of Defects in SiC Crystals by Raman Scattering

✍ Choyke, W. J.; Matsunami, H.; Pensl, G. 📂 Article 📅 2004 🏛 Springer Berlin Heidelberg 🌐 English ⚖ 586 KB

Since the 1997 publication of "Silicon Carbide - A Review of Fundamental Questions and Applications to Current Device Technology" edited by Choyke, et al., there has been impressive progress in both the fundamental and developmental aspects of the SiC field. So there is a growing need to update the

7556. Characterization of ion-implanted

7556. Characterization of ion-implanted and rapridly thermal annealed GaAs by Raman scattering and van der Pauw measurement: H Yoshida and T Katoda,J Appl Phys,67, 1990, 7281–7286

📂 Article 📅 1991 🏛 Elsevier Science 🌐 English ⚖ 153 KB