Deep submicrometer SOI MOSFET drain current model including series resistance, self-heating and velocity overshoot effects

✍ Scribed by Roldan, J.B.; Gamiz, F.; Lopez-Villanueva, J.A.; Cartujo-Cassinello, P.

• Book ID: 111919664
• Publisher: IEEE
• Year: 2000
• Tongue: English
• Weight: 67 KB
• Volume: 21
• Category: Article
• ISSN: 0741-3106
• DOI: 10.1109/55.841308