A model for the drain current of deep submicrometer MOSFETs including electron-velocity overshoot

✍ Scribed by Roldan, J.B.; Gamiz, F.; Lopez-Villanueva, J.A.; Cartujo, P.; Carceller, J.E.

• Book ID: 114537465
• Publisher: IEEE
• Year: 1998
• Tongue: English
• Weight: 85 KB
• Volume: 45
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/16.725262