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Deembedding Accuracy for Device Scale and Interconnection Line Parasitics

✍ Scribed by Jaeho Lee, ; Jaehong Lee, ; Jongwook Jeon, ; Hee Sauk Jhon, ; Hyungcheol Shin

Book ID: 121474829
Publisher: IEEE
Year: 2009
Tongue: English
Weight: 290 KB
Volume: 19
Category: Article
ISSN: 1531-1309
DOI: 10.1109/LMWC.2009.2032011

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