Deducing the Fatigue Crack Growth Rates of Natural Flaws in Silicon Nitride Ceramics: Role of R -Curves

✍ Scribed by Härtelt, Martin; Fünfschilling, Stefan; Schwind, Thomas; Riesch-Oppermann, Heinz; Fett, Theo; Kruzic, Jamie J.; Marshall, D. B.

• Book ID: 120944024
• Publisher: John Wiley and Sons
• Year: 2013
• Tongue: English
• Weight: 518 KB
• Volume: 96
• Category: Article
• ISSN: 0002-7820
• DOI: 10.1111/jace.12410