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Debugging reversible circuits

✍ Scribed by Robert Wille; Daniel Große; Stefan Frehse; Gerhard W. Dueck; Rolf Drechsler


Book ID
108298651
Publisher
Elsevier Science
Year
2011
Tongue
English
Weight
722 KB
Volume
44
Category
Article
ISSN
0167-9260

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This article deals with prototype validation of VLSI circuits. Circuits are observed using electron-beam probing used in voltage contrast mode, in such a way that grey level images are obtained and processed in order to determine potential values of connexions. These values are compared against refe